Where Used List (Table) for SAP ABAP Data Element QTSTICHPRO (Partial Samples Possible)
SAP ABAP Data Element QTSTICHPRO (Partial Samples Possible) is used by
# | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
---|---|---|---|---|---|---|
1 | Table | BAPI2045D1 - SAMPLES | Insp. specifications-insp. lot characs. | QL | APPL | SAP_APPL |
2 | Table | COMES_INSP_CHAR - SAMPLES | Characteristics for the Inspection Lot (MES Integration) | CO_MES_INT | APPL | SAP_APPL |
3 | Table | MCQAQR - TSTICHPRKZ | Insp. result-sample/charac.: Communication structure | QG02 | APPL | SAP_APPL |
4 | Table | MCQAQRB - TSTICHPRKZ | Insp. result-sample/charac.: Communication structure | QG02 | APPL | SAP_APPL |
5 | Table | MCQAQRB_BW - TSTICHPRKZ | Comm. structure: Inspection results with cancellation flag | QMEX | PI_APPL | SAP_APPL |
6 | Table | MCQAQRX - TSTICHPRKZ | Insp. result-sample/charac.: Communication structure | QMEX | PI_APPL | SAP_APPL |
7 | Table | MCQAQR_FG - TSTICHPRKZ | Insp. result-sample/charac.: Scores | QG02 | APPL | SAP_APPL |
8 | Table | MCQAQR_KYF - TSTICHPRKZ | Comm. structure: Inspection results - key figures | QMEX | PI_APPL | SAP_APPL |
9 | Table | OPS_RQEEAS20_TSTR4_PDF - TSTICHPRKZ | Inspection Instruction | QE | APPL | SAP_APPL |
10 | Table | QAIMV - KZTSTICHPR | Characteristic specs. for download to complex QM subsystems | QEIF | APPL | SAP_APPL |
11 | Table | QAIMV_O1 - KZTSTICHPR | Characteristic Specs. for Download to Complex QM Subsystems | QEIF | APPL | SAP_APPL |
12 | Table | QALTPPMV - TSTICHPRKZ | Characteristic specifications for inspection point | QG01 | APPL | SAP_APPL |
13 | Table | QAMKR - TSTICHPRKZ | Specifications and results for the characteristic | QE | APPL | SAP_APPL |
14 | Table | QAMSV - TSTICHPRKZ | Specifications for inspection characteristics | QE | APPL | SAP_APPL |
15 | Table | QAMV - TSTICHPRKZ | Characteristic specifications for inspection processing | QE | APPL | SAP_APPL |
16 | Table | QAPMV - TSTICHPRKZ | Characteristic specifications for inspection point | QG01 | APPL | SAP_APPL |
17 | Table | QEMKINFO - TSTICHPRKZ | Information for Inspection Characteristic | QE | APPL | SAP_APPL |
18 | Table | QEWW - SAMPLES | General Work Structure for Results Recording | QEWW | APPL | SAP_APPL |
19 | Table | QFFED - TSTICHPRKZ | Screen fields for defects recording | QF | APPL | SAP_APPL |
20 | Table | QFMKR - TSTICHPRKZ | Interface structure for characteristic (defects recording) | QF | APPL | SAP_APPL |
21 | Table | QGEVAL_CHARACTERISTIC - TSTICHPRKZ | QM Evaluations: Data Structure for Characteristics | QG_EVAL | EA-PLM | EA-APPL |
22 | Table | QGEVAL_SINGLE_VALUE - TSTICHPRKZ | QM Evaluations: Data Structure for Single Values | QG_EVAL | EA-PLM | EA-APPL |
23 | Table | QGEVAL_TS_CHARACTERISTIC_VIEW - TSTICHPRKZ | Structure for Characteristics Table | QG_EVAL | EA-PLM | EA-APPL |
24 | Table | QGEVAL_TS_SINGLE_VALUE - TSTICHPRKZ | Alternative Table View for Single Values | QG_EVAL | EA-PLM | EA-APPL |
25 | Table | QGMK - TSTICHPRKZ | QM: Specifications and results for insp. charac. (GLV) | QG01 | APPL | SAP_APPL |
26 | Table | RPLM_TS_POWL_INSP_CHAR - TSTICHPRKZ | Information for Inspection Characteristic | RPLM_QIMT_BE | EA-PLM | EA-APPL |
27 | Table | RPLM_TS_QI_INSP_CHAR_LEVEL_INT - PARTIAL_SAMPLES | RPLM QI - Info for Inspection Result - Characteristic Level | RPLM_QI_BE | EA-PLM | EA-APPL |
28 | Table | TQ78 - TSTICHPRKZ | Status-dependent processing table for insp. characteristics | QE | APPL | SAP_APPL |