Where Used List (Table) for SAP ABAP Data Element QLIFKZ (Vendor Considered for Dynamic Modification)
SAP ABAP Data Element QLIFKZ (Vendor Considered for Dynamic Modification) is used by
# | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
---|---|---|---|---|---|---|
1 | Table | BAPI1012_CHA_C - DYN_MODIF_BY_VENDOR | Inspection Characteristics in CREATE-BAPI for Routings | QP | APPL | SAP_APPL |
2 | Table | BAPI1012_TSK_C - DYN_MODIF_BY_VENDOR | Task list header data in CREATE-BAPI for routings | CP | APPL | SAP_APPL |
3 | Table | BAPI1191_CHA_C - DYN_MODIF_BY_VENDOR | Inspection Characteristics in CREATE-BAPI for Insp. Plans | QP | APPL | SAP_APPL |
4 | Table | BAPI1191_TSK_C - DYN_MODIF_BY_VENDOR | Task List Header Data in CREATE-BAPI for Inspection Plans | QP | APPL | SAP_APPL |
5 | Table | BIPKO - LIEFKZ | Batch Input Structure for Task List Header | CP | APPL | SAP_APPL |
6 | Table | BIPMK - LIEFKZ | Inspection characteristics for batch input of task lists | QP | APPL | SAP_APPL |
7 | Table | CHA_CLASS_DATA - LIEFKZ | Data for the class of inspection charcteristics | CP | APPL | SAP_APPL |
8 | Table | CHA_CLASS_DATA_INTERFACE - LIEFKZ | Insp. charac. (int. format) for Direct Input in the EWB | CP | APPL | SAP_APPL |
9 | Table | CHA_CLASS_DATA_PLAIN - LIEFKZ | Insp. charac. (ext. format) for Direct Input in the EWB | CP | APPL | SAP_APPL |
10 | Table | CHA_INFO - LIEFKZ | Extra fields for PLMK (insp. char.) | CP | APPL | SAP_APPL |
11 | Table | CPS_TASK_LIST_MAINT_CHA - DYN_MODIF_BY_VENDOR | Maint. Task List: Inspection Characteristics | CP | APPL | SAP_APPL |
12 | Table | CPS_TASK_LIST_MAINT_TSK - DYN_MODIF_BY_VENDOR | Maint. Task List: Task Lists | CP | APPL | SAP_APPL |
13 | Table | LDPS_CHA_ALL - LIEFKZ | Transfer Inspection Characteristics to Print Module | LALD | APPL | SAP_APPL |
14 | Table | LDPS_CHA_DATA - LIEFKZ | Inspection Characteristics for OMS | LALD | APPL | SAP_APPL |
15 | Table | QDYNKRIT - LIEFKZ | Dynamic modification indicator: include structure | QP | APPL | SAP_APPL |
16 | Table | QMIPS_INSP_CHA - DYN_MODIF_BY_VENDOR | Inspection Characteristic with Additional Information | QMIP_EA | EA-PLM | EA-APPL |
17 | Table | QPCPS_RFC_CHA_DATA - DYN_MODIF_BY_VENDOR | Enhanced RFC Interface for Inspection Characteristics | QPCP | EA-PLM | EA-APPL |
18 | Table | RQPAS - LIEFKZ | Inspection characteristic (plan) control string | QP | APPL | SAP_APPL |
19 | Table | TQ39 - LIEFKZ | Dynamic modification criteria | QM00 | APPL | SAP_APPL |
20 | Table | TSK_CLASS_DATA - LIEFKZ | Data for the class of task lists | CP | APPL | SAP_APPL |
21 | Table | TSK_CLASS_DATA_INTERFACE - LIEFKZ | TL header data (int. format) for Direct Input in the EWB | CP | APPL | SAP_APPL |
22 | Table | TSK_CLASS_DATA_PLAIN - LIEFKZ | TL header data (ext. format) for Direct Input in the EWB | CP | APPL | SAP_APPL |