Where Used List (Table) for SAP ABAP Data Element PRUEFKL (Validation class for independent validations)
SAP ABAP Data Element PRUEFKL (Validation class for independent validations) is used by
# | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
---|---|---|---|---|---|---|
1 | Table | EABLD - PRUEFKL | Screen Flds for MR Doc. | EE17 | IS-U/CCS | IS-UT |
2 | Table | ECAMIO_REABLD - PRUEFKL | Screen Fields for Move-In/Out Fast Entry | EE17 | IS-U/CCS | IS-UT |
3 | Table | EMG_DEVMOD_ZW_MOD - PRUEFKL | IS-U Migration: Help Structure for DEVICEMOD | EEMI_ISU | IS-U/CCS | IS-UT |
4 | Table | EMG_SAPRE_DMM_DVM_01_04 - PRUEFKL | Migration Object SAPRE - DEV_MGMT | EEMI_ISU | IS-U/CCS | IS-UT |
5 | Table | EMG_SAPRE_DMM_DVM_01_06 - PRUEFKL | Migration Object SAPRE - DEV_MGMT | EEMI_ISU | IS-U/CCS | IS-UT |
6 | Table | EMG_SAPRE_DMM_INM_01_02 - PRUEFKLE | Migration Object SAPRE - DEV_MGMT | EEMI_ISU | IS-U/CCS | IS-UT |
7 | Table | EMG_SAPRE_DMM_INM_01_02 - PRUEFKLA | Migration Object SAPRE - DEV_MGMT | EEMI_ISU | IS-U/CCS | IS-UT |
8 | Table | ETDZ - PRUEFKL | Technical Data for Installed Register | EE07 | IS-U/CCS | IS-UT |
9 | Table | ETDZ_MOD - PRUEFKL | Technical Data for Installed Reg. + Modif. | EE07 | IS-U/CCS | IS-UT |
10 | Table | ETRF - PRUEFKL | Rate (Head. Data) | EE20 | IS-U/CCS | IS-UT |
11 | Table | ETRFD - PRUEFKL | Scrn Fld List for Rate | EE20 | IS-U/CCS | IS-UT |
12 | Table | EUI_SCREEN_DETAIL_T - PRUEFKL | Structer of Table: Tab Details | EE_EDM_UI | IS-U/CCS | IS-UT |
13 | Table | EZWG - PRUEFKL | Register Group | EE10 | IS-U/CCS | IS-UT |
14 | Table | EZWGD - PRUEFKL | Structure with Screen Fields for Register Group | EE10 | IS-U/CCS | IS-UT |
15 | Table | ISU07_ZW - PRUEFKLA | Register Data for Installation, Removal, and Replacement | EE07 | IS-U/CCS | IS-UT |
16 | Table | ISU07_ZW - PRUEFKLE | Register Data for Installation, Removal, and Replacement | EE07 | IS-U/CCS | IS-UT |
17 | Table | ISU_RATE_REGDATA - PRUEFKL | Register Data from the Rate | EE20 | IS-U/CCS | IS-UT |
18 | Table | REABLD - PRUEFKL | Screen Fields for Entry/Correction Initial Screen | EE17 | IS-U/CCS | IS-UT |
19 | Table | REG30 - PRUEFKLE | Screen Fields: Inst./Rem./Repl./Break Up | EE07 | IS-U/CCS | IS-UT |
20 | Table | REG30_AUTO_ZW_MOD - PRUEFKLE | Automation Data for Modification of Registers in Inst./Rep. | EE07 | IS-U/CCS | IS-UT |
21 | Table | REG30_ZW - PRUEFKLE | Screen Fields: Inst./Removal/Repl./Break Up (Table Control) | EE07 | IS-U/CCS | IS-UT |
22 | Table | REG30_ZW_C - PRUEFKLE | Data at register level for EG30 - EG36 | EE07 | IS-U/CCS | IS-UT |
23 | Table | REG30_ZW_C - PRUEFKLA | Data at register level for EG30 - EG36 | EE07 | IS-U/CCS | IS-UT |
24 | Table | REG30_ZW_C_A - PRUEFKLA | Register Data for EG30 - EG36 (Old Device) | EE07 | IS-U/CCS | IS-UT |
25 | Table | REG30_ZW_I - PRUEFKLE | Input Fields: Inst./Removal/Repl./Break Up (Table Control) | EE07 | IS-U/CCS | IS-UT |
26 | Table | REG30_ZW_I_E - PRUEFKLE | Input Fields (New Device): Inst./Rem./Repl./Terminate | EE07 | IS-U/CCS | IS-UT |
27 | Table | REG42_ZW - PRUEFKL | Device Modification: Display Data at Register Level | EE07 | IS-U/CCS | IS-UT |
28 | Table | REG42_ZW_INPUT - PRUEFKL | Device Modification: Input Data at Register Level | EE07 | IS-U/CCS | IS-UT |
29 | Table | REG42_ZW_INPUT_LAST_TIMSLICE - PRUEFKL | Device Mod.: Input Data at Reg. Level for Last Time Slice | EE07 | IS-U/CCS | IS-UT |
30 | Table | REG60_N - PRUEFKL | Screen Fields: New Allocation of Logical Reg.Numbers | EE07 | IS-U/CCS | IS-UT |
31 | Table | REG60_O - PRUEFKL | Screen Fields: Old Allocation of Logical Reg.Numbers | EE07 | IS-U/CCS | IS-UT |
32 | Table | TE121 - PRUEFKL | Tolerance Limits of Independent Validations | EE17 | IS-U/CCS | IS-UT |
33 | Table | TE219 - PRUEFKL | Independent Validations (Control Table) | EE17 | IS-U/CCS | IS-UT |
34 | Table | TE220 - PRUEFKL | User-Defined Independent Validations | EE17 | IS-U/CCS | IS-UT |
35 | Table | TE408 - PRUEFKL | Check Classes of Independent Validations | EE17 | IS-U/CCS | IS-UT |
36 | Table | TE408T - PRUEFKL | Check Classes of Independent Validations (Texts) | EE17 | IS-U/CCS | IS-UT |
37 | Table | TE409 - PRUEFKL | Parameters for Independent Validations | EE17 | IS-U/CCS | IS-UT |
38 | Table | VETDZ - PRUEFKL | Change Document Structure; Generated by RSSCD000 | EE07 | IS-U/CCS | IS-UT |
39 | Table | VEZWG - PRUEFKL | Change Document Structure; Generated by RSSCD000 | EE10 | IS-U/CCS | IS-UT |