Where Used List (Data Element) for SAP ABAP Domain QANZAHL4 (Whole number INT4)
SAP ABAP Domain QANZAHL4 (Whole number INT4) is used by
# | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
---|---|---|---|---|---|---|
1 | Data Element | /SAPHT/SPCZQBINQUAN1 | Previous bin quantity | /SAPHT/SPCZQE1 | DIMP | ECC-DIMP |
2 | Data Element | /SAPHT/SPCZQBINQUAN2 | Current bin quantity | /SAPHT/SPCZQE1 | DIMP | ECC-DIMP |
3 | Data Element | QANZAHL4 | QM: General Count Field (Int. Use) | QB | APPL | SAP_APPL |
4 | Data Element | QANZENTN | Number of Primary Samples | QPR | APPL | SAP_APPL |
5 | Data Element | QANZFEHEH4 | Number of Nonconforming Sample Units | QE | APPL | SAP_APPL |
6 | Data Element | QANZFEHL4 | Number of Defects Found | QE | APPL | SAP_APPL |
7 | Data Element | QANZKLASEH | Class Size (in Sample Units) | QE | APPL | SAP_APPL |
8 | Data Element | QANZMISCH | Number of Pooled Samples | QPR | APPL | SAP_APPL |
9 | Data Element | QANZWERTG4 | Number of Inspected Sample Units | QE | APPL | SAP_APPL |
10 | Data Element | QANZWERTO4 | Number of Measured Values Above the Tolerance Range | QE | APPL | SAP_APPL |
11 | Data Element | QANZWERTP4 | Number of Single Results that Are Missing | QE | APPL | SAP_APPL |
12 | Data Element | QANZWERTU4 | Number of Measured Values Below the Tolerance Range | QE | APPL | SAP_APPL |
13 | Data Element | QANZ_FEHLR | Total Number of Defects Recorded for an Inspection Lot | QV | APPL | SAP_APPL |
14 | Data Element | QGESSTPUMF | Total Sample Size | QM01 | APPL | SAP_APPL |
15 | Data Element | QGESUMF | Sample Size that Has to Be Inspected for a Characteristic | QE | APPL | SAP_APPL |
16 | Data Element | QISTSTPUMF | Number of Recorded Sample Units | QE | APPL | SAP_APPL |
17 | Data Element | QKLASSE_A | Absolute Frequency of Quality Score Class A | QG02 | APPL | SAP_APPL |
18 | Data Element | QKLASSE_B | Absolute Frequency of Quality Score Class B | QG02 | APPL | SAP_APPL |
19 | Data Element | QKLASSE_C | Absolute Frequency of Quality Score Class C | QG02 | APPL | SAP_APPL |
20 | Data Element | QKLASSE_D | Absolute Frequency of Quality Score Class D | QG02 | APPL | SAP_APPL |
21 | Data Element | QKLASSE_E | Absolute Frequency of Quality Score Class E | QG02 | APPL | SAP_APPL |
22 | Data Element | QQRKIPAR | Statistical Parameter in a Control Chart | QM01 | APPL | SAP_APPL |
23 | Data Element | QQRKIPAR1 | Statistical Parameter in a Control Chart | QM01 | APPL | SAP_APPL |
24 | Data Element | QQRKIPAR2 | Statistical Parameter in a Control Chart | QM01 | APPL | SAP_APPL |
25 | Data Element | QSTIPROUMF | Sample Size that Must Be Inspected | QE | APPL | SAP_APPL |
26 | Data Element | QSTPRUMF | Number of Sampling Units in a Sample | QD | APPL | SAP_APPL |
27 | Data Element | QSTPRUMFP | Number of Sampling Units in a Sample | QDSE | APPL | SAP_APPL |
28 | Data Element | QTABIXN | Current Item in the Processing Table | QE | APPL | SAP_APPL |
29 | Data Element | QTFILLN | Scope of the Processing Table | QE | APPL | SAP_APPL |
30 | Data Element | QZHLABBR | Number of Inspection Lots with Discontinued Inspections | QG02 | APPL | SAP_APPL |
31 | Data Element | QZHLANGENS | Number of Accepted Inspection Lots (Including Skips) | QG02 | APPL | SAP_APPL |
32 | Data Element | QZHLERSTMU | Number of Model Inspection Lots | QG02 | APPL | SAP_APPL |
33 | Data Element | QZHLF | No. of Defects | QG02 | APPL | SAP_APPL |
34 | Data Element | QZHLFEHL | Number of Defects | QG03 | APPL | SAP_APPL |
35 | Data Element | QZHLFPRF | No. of Defective Units To Be Inspected | QG03 | APPL | SAP_APPL |
36 | Data Element | QZHLGESAMT | Number of Summarized Inspection Lots | QG02 | APPL | SAP_APPL |
37 | Data Element | QZHLLOSANT | Number of Summarized Lots (Including Share of Scrap) | QG02 | APPL | SAP_APPL |
38 | Data Element | QZHLLOSDR | Number of Summarized Inspection Lots (Lead Time) | QG02 | APPL | SAP_APPL |
39 | Data Element | QZHLLOSQKZ | Number of Summarized Inspection Lots for Quality Score | QG02 | APPL | SAP_APPL |
40 | Data Element | QZHLN | Number of Inspected and Closed Samples | QG02 | APPL | SAP_APPL |
41 | Data Element | QZHLNA | Number of Accepted Samples | QG02 | APPL | SAP_APPL |
42 | Data Element | QZHLNF | No. of Defects | QG02 | APPL | SAP_APPL |
43 | Data Element | QZHLNFEH | Number of Nonconforming Units | QG02 | APPL | SAP_APPL |
44 | Data Element | QZHLNHF | No. of Samples with Major Defect as Defect Class | QG02 | APPL | SAP_APPL |
45 | Data Element | QZHLNKF | No. of Samples with Critical Defect as Defect Class | QG02 | APPL | SAP_APPL |
46 | Data Element | QZHLNNF | Number of Samples with Minor Defect as Defect Class | QG02 | APPL | SAP_APPL |
47 | Data Element | QZHLNR | Number of Rejected Samples | QG02 | APPL | SAP_APPL |
48 | Data Element | QZHLNSKIP | Number of Skipped Samples | QG02 | APPL | SAP_APPL |
49 | Data Element | QZHLNSTAT | Number of Valid Single Values | QG02 | APPL | SAP_APPL |
50 | Data Element | QZHLNSTPF | Sample Size (No. of Valid Values in Sample) | QG02 | APPL | SAP_APPL |
51 | Data Element | QZHLNTOLO | Number of Values Above Upper Tolerance | QG02 | APPL | SAP_APPL |
52 | Data Element | QZHLNTOLU | Number of Values Below Lower Tolerance | QG02 | APPL | SAP_APPL |
53 | Data Element | QZHLOFFMK | Number of Insp. Lots with Outstanding Long-Term Characs | QG02 | APPL | SAP_APPL |
54 | Data Element | QZHLRUECK | Number of Rejected Inspection Lots | QG02 | APPL | SAP_APPL |
55 | Data Element | QZHLSELECT | Number of Summarized Inspection Lots (Without Cancellation) | QG02 | APPL | SAP_APPL |
56 | Data Element | QZHLSKIP | Number of Skipped Inspection Lots | QG02 | APPL | SAP_APPL |
57 | Data Element | QZHLSTORNO | Number of Cancelled Inspection Lots | QG02 | APPL | SAP_APPL |
58 | Data Element | QZHL_ILOTS | Number of inspection lots | QMEX | PI_APPL | SAP_APPL |
59 | Data Element | QZHL_ILOTS_ACC | Number of accepted inspection lots (including skips) | QMEX | PI_APPL | SAP_APPL |
60 | Data Element | QZHL_ILOTS_REJ | Number of rejected inspection lots | QMEX | PI_APPL | SAP_APPL |
61 | Data Element | QZHL_ILOTS_SKIP | Number of lots with skip | QMEX | PI_APPL | SAP_APPL |
62 | Data Element | WOFFSET | Offset with start in cycle | IPRM | APPL | SAP_APPL |