SAP ABAP Data Element QZHLNKF (No. of Samples with Critical Defect as Defect Class)
Hierarchy
☛
SAP_APPL (Software Component) Logistics and Accounting
⤷
QM-QC-IS (Application Component) Information System
⤷
QG02 (Package) QM quality information system
SAP_APPL (Software Component) Logistics and Accounting⤷
QM-QC-IS (Application Component) Information System⤷
QG02 (Package) QM quality information system
Basic Data
| Data Element | QZHLNKF |
| Short Description | No. of Samples with Critical Defect as Defect Class |
Data Type
| Category of Dictionary Type | D | Domain |
| Type of Object Referenced | No Information | |
| Domain / Name of Reference Type | QANZAHL4 | |
| Data Type | INT4 | 4-byte integer, integer number with sign |
| Length | 10 | |
| Decimal Places | 0 | |
| Output Length | 8 | |
| Value Table |
Further Characteristics
| Search Help: Name | ||
| Search Help: Parameters | ||
| Parameter ID | ||
| Default Component name | ||
| Change document | ||
| No Input History | ||
| Basic direction is set to LTR | ||
| No BIDI Filtering |
Field Label
| Length | Field Label | |
| Short | 10 | CritDefect |
| Medium | 15 | Crit. defect |
| Long | 20 | SampsWithCritDefect |
| Heading | 10 | CritDefect |
Documentation
Definition
Total number of samples that had at least one critical defect when inspected.
History
| Last changed by/on | SAP | 19970812 |
| SAP Release Created in |
