SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.)
Hierarchy
☛
IS-UT (Software Component) SAP Utilities/Telecommunication
⤷ IS-U-DM (Application Component) Device Management
⤷ EE10 (Package) IS-U: Device Management
⤷ IS-U-DM (Application Component) Device Management
⤷ EE10 (Package) IS-U: Device Management
Basic Data
Table Category | TRANSP | Transparent table |
Transparent table | TE270 | Table Relationship Diagram |
Short Description | System Parameters for Sampling Proc./Cert. in IS-U DevMan. |
Delivery and Maintenance
Pool/cluster | ||
Delivery Class | C | Customizing table, maintenance only by cust., not SAP import |
Data Browser/Table View Maintenance | X | Display/Maintenance Allowed |
Components
Field | Key | Data Element | Domain | Data Type |
Length | Decimal Places |
Short Description | Check table |
|
---|---|---|---|---|---|---|---|---|---|
1 | MANDT | MANDT | MANDT | CLNT | 3 | 0 | Client | T000 | |
2 | VERLOS | VERLOS | AKTKN | CHAR | 1 | 0 | Indicator: Loss of lot membership if removed/replaced | ||
3 | VERBGL | VERBGL | AKTKN | CHAR | 1 | 0 | Loss of certifiction if removed/replaced | ||
4 | BGLLOS | BGLLOS | KENNZX | CHAR | 1 | 0 | Device certification failure leads to loss of lot membership | ||
5 | INTPRF | INTPRF | KENNZX | CHAR | 1 | 0 | Internal cert. period is longer than calibration validity | ||
6 | LOSLAGER | LOSLAGER | KENNZX | CHAR | 1 | 0 | Uninstalled Devices Can Be Allocated to Lot | ||
7 | CHLOS | CHLOS | KENNZX | CHAR | 1 | 0 | Manipulation of devices despite lot inspection/drawing | ||
8 | LAGINC | LAGINC | KENNZX | CHAR | 1 | 0 | Warehouse devices allowed as sample devices | ||
9 | NLEG97 | NLEG97 | KENNZX | CHAR | 1 | 0 | Certification/seal extension control | ||
10 | NLBGLJ | NLBGLJ | KENNZX | CHAR | 1 | 0 | Certification year same as installation year | ||
11 | CHSTI | CHSTI | KENNZX | CHAR | 1 | 0 | Repeated use of devices for inspection | ||
12 | CHBGL | CHBGL | KENNZX | CHAR | 1 | 0 | Retain lot membership during certification | ||
13 | CERTDEV | CERTDEV | KENNZX | CHAR | 1 | 0 | Certification period of device overrides lot | ||
14 | CERTLOTDEV | CERTLOTDEV | AKTKN | CHAR | 1 | 0 | Only certified devices can be allocated to lots | ||
15 | NO_SAMPLE_DEV | NO_SAMPLE_DEV | KENNZX | CHAR | 1 | 0 | Exclude devices from sample drawing in I/R/R | ||
16 | SEALDATECHECK | SEALDATECHECK | KENNZX | CHAR | 1 | 0 | Check Last Seal Date Against Current Date | ||
17 | LOT_BREAKUP_PERI | LOT_BREAKUP_PERIOD | NUMC | 1 | 0 | No. of Years Within Which Lot Devices Must Be Replaced |
Foreign Keys
Source Table | Source Column | Foreign Table | Foreign Column | Dependency Factor | Cardinality left | Cardinality right | |
---|---|---|---|---|---|---|---|
1 | TE270 | MANDT | T000 | MANDT | KEY | 1 | CN |
History
Last changed by/on | SAP | 20050224 |
SAP Release Created in |