SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.)
Hierarchy
☛
IS-UT (Software Component) SAP Utilities/Telecommunication
⤷
IS-U-DM (Application Component) Device Management
⤷
EE10 (Package) IS-U: Device Management
⤷
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Basic Data
| Table Category | TRANSP | Transparent table |
| Transparent table | TE270 |
|
| Short Description | System Parameters for Sampling Proc./Cert. in IS-U DevMan. |
Delivery and Maintenance
| Pool/cluster | ||
| Delivery Class | C | Customizing table, maintenance only by cust., not SAP import |
| Data Browser/Table View Maintenance | X | Display/Maintenance Allowed |
Components
| |
Field | Key | Data Element | Domain | Data Type |
Length | Decimal Places |
Short Description | Check table |
|---|---|---|---|---|---|---|---|---|---|
| 1 | |
MANDT | MANDT | CLNT | 3 | 0 | Client | T000 | |
| 2 | |
VERLOS | AKTKN | CHAR | 1 | 0 | Indicator: Loss of lot membership if removed/replaced | ||
| 3 | |
VERBGL | AKTKN | CHAR | 1 | 0 | Loss of certifiction if removed/replaced | ||
| 4 | |
BGLLOS | KENNZX | CHAR | 1 | 0 | Device certification failure leads to loss of lot membership | ||
| 5 | |
INTPRF | KENNZX | CHAR | 1 | 0 | Internal cert. period is longer than calibration validity | ||
| 6 | |
LOSLAGER | KENNZX | CHAR | 1 | 0 | Uninstalled Devices Can Be Allocated to Lot | ||
| 7 | |
CHLOS | KENNZX | CHAR | 1 | 0 | Manipulation of devices despite lot inspection/drawing | ||
| 8 | |
LAGINC | KENNZX | CHAR | 1 | 0 | Warehouse devices allowed as sample devices | ||
| 9 | |
NLEG97 | KENNZX | CHAR | 1 | 0 | Certification/seal extension control | ||
| 10 | |
NLBGLJ | KENNZX | CHAR | 1 | 0 | Certification year same as installation year | ||
| 11 | |
CHSTI | KENNZX | CHAR | 1 | 0 | Repeated use of devices for inspection | ||
| 12 | |
CHBGL | KENNZX | CHAR | 1 | 0 | Retain lot membership during certification | ||
| 13 | |
CERTDEV | KENNZX | CHAR | 1 | 0 | Certification period of device overrides lot | ||
| 14 | |
CERTLOTDEV | AKTKN | CHAR | 1 | 0 | Only certified devices can be allocated to lots | ||
| 15 | |
NO_SAMPLE_DEV | KENNZX | CHAR | 1 | 0 | Exclude devices from sample drawing in I/R/R | ||
| 16 | |
SEALDATECHECK | KENNZX | CHAR | 1 | 0 | Check Last Seal Date Against Current Date | ||
| 17 | |
LOT_BREAKUP_PERIOD | NUMC | 1 | 0 | No. of Years Within Which Lot Devices Must Be Replaced |
Foreign Keys
| |
Source Table | Source Column | Foreign Table | Foreign Column | Dependency Factor | Cardinality left | Cardinality right |
|---|---|---|---|---|---|---|---|
| 1 | TE270 | MANDT | |
|
KEY | 1 | CN |
History
| Last changed by/on | SAP | 20050224 |
| SAP Release Created in |