SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.)
Hierarchy
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IS-UT (Software Component) SAP Utilities/Telecommunication
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IS-U-DM (Application Component) Device Management
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EE10 (Package) IS-U: Device Management

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Basic Data
Table Category | TRANSP | Transparent table |
Transparent table | TE270 |
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Short Description | System Parameters for Sampling Proc./Cert. in IS-U DevMan. |
Delivery and Maintenance
Pool/cluster | ||
Delivery Class | C | Customizing table, maintenance only by cust., not SAP import |
Data Browser/Table View Maintenance | X | Display/Maintenance Allowed |
Components
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Field | Key | Data Element | Domain | Data Type |
Length | Decimal Places |
Short Description | Check table |
---|---|---|---|---|---|---|---|---|---|
1 | ![]() |
MANDT | MANDT | CLNT | 3 | 0 | Client | T000 | |
2 | ![]() |
VERLOS | AKTKN | CHAR | 1 | 0 | Indicator: Loss of lot membership if removed/replaced | ||
3 | ![]() |
VERBGL | AKTKN | CHAR | 1 | 0 | Loss of certifiction if removed/replaced | ||
4 | ![]() |
BGLLOS | KENNZX | CHAR | 1 | 0 | Device certification failure leads to loss of lot membership | ||
5 | ![]() |
INTPRF | KENNZX | CHAR | 1 | 0 | Internal cert. period is longer than calibration validity | ||
6 | ![]() |
LOSLAGER | KENNZX | CHAR | 1 | 0 | Uninstalled Devices Can Be Allocated to Lot | ||
7 | ![]() |
CHLOS | KENNZX | CHAR | 1 | 0 | Manipulation of devices despite lot inspection/drawing | ||
8 | ![]() |
LAGINC | KENNZX | CHAR | 1 | 0 | Warehouse devices allowed as sample devices | ||
9 | ![]() |
NLEG97 | KENNZX | CHAR | 1 | 0 | Certification/seal extension control | ||
10 | ![]() |
NLBGLJ | KENNZX | CHAR | 1 | 0 | Certification year same as installation year | ||
11 | ![]() |
CHSTI | KENNZX | CHAR | 1 | 0 | Repeated use of devices for inspection | ||
12 | ![]() |
CHBGL | KENNZX | CHAR | 1 | 0 | Retain lot membership during certification | ||
13 | ![]() |
CERTDEV | KENNZX | CHAR | 1 | 0 | Certification period of device overrides lot | ||
14 | ![]() |
CERTLOTDEV | AKTKN | CHAR | 1 | 0 | Only certified devices can be allocated to lots | ||
15 | ![]() |
NO_SAMPLE_DEV | KENNZX | CHAR | 1 | 0 | Exclude devices from sample drawing in I/R/R | ||
16 | ![]() |
SEALDATECHECK | KENNZX | CHAR | 1 | 0 | Check Last Seal Date Against Current Date | ||
17 | ![]() |
LOT_BREAKUP_PERIOD | NUMC | 1 | 0 | No. of Years Within Which Lot Devices Must Be Replaced |
Foreign Keys
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Source Table | Source Column | Foreign Table | Foreign Column | Dependency Factor | Cardinality left | Cardinality right |
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1 | TE270 | MANDT | ![]() |
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KEY | 1 | CN |
History
Last changed by/on | SAP | 20050224 |
SAP Release Created in |