Data Element list used by SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.)
SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.) is using
# Object Type Object Name Object Description Note
     
1 Data Element  BGLLOS Device certification failure leads to loss of lot membership
2 Data Element  CERTDEV Certification period of device overrides lot
3 Data Element  CERTLOTDEV Only certified devices can be allocated to lots
4 Data Element  CHBGL Retain lot membership during certification
5 Data Element  CHLOS Manipulation of devices despite lot inspection/drawing
6 Data Element  CHSTI Repeated use of devices for inspection
7 Data Element  INTPRF Internal cert. period is longer than calibration validity
8 Data Element  LAGINC Warehouse devices allowed as sample devices
9 Data Element  LOSLAGER Uninstalled Devices Can Be Allocated to Lot
10 Data Element  LOT_BREAKUP_PERIOD No. of Years Within Which Lot Devices Must Be Replaced
11 Data Element  MANDT Client
12 Data Element  NLBGLJ Certification year same as installation year
13 Data Element  NLEG97 Certification/seal extension control
14 Data Element  NO_SAMPLE_DEV Exclude devices from sample drawing in I/R/R
15 Data Element  SEALDATECHECK Check Last Seal Date Against Current Date
16 Data Element  VERBGL Loss of certifiction if removed/replaced
17 Data Element  VERLOS Indicator: Loss of lot membership if removed/replaced