Data Element list used by SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.)
SAP ABAP Table
TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.) is using
| # | Object Type | Object Name | Object Description | Note |
|---|---|---|---|---|
| 1 | BGLLOS | Device certification failure leads to loss of lot membership | ||
| 2 | CERTDEV | Certification period of device overrides lot | ||
| 3 | CERTLOTDEV | Only certified devices can be allocated to lots | ||
| 4 | CHBGL | Retain lot membership during certification | ||
| 5 | CHLOS | Manipulation of devices despite lot inspection/drawing | ||
| 6 | CHSTI | Repeated use of devices for inspection | ||
| 7 | INTPRF | Internal cert. period is longer than calibration validity | ||
| 8 | LAGINC | Warehouse devices allowed as sample devices | ||
| 9 | LOSLAGER | Uninstalled Devices Can Be Allocated to Lot | ||
| 10 | LOT_BREAKUP_PERIOD | No. of Years Within Which Lot Devices Must Be Replaced | ||
| 11 | MANDT | Client | ||
| 12 | NLBGLJ | Certification year same as installation year | ||
| 13 | NLEG97 | Certification/seal extension control | ||
| 14 | NO_SAMPLE_DEV | Exclude devices from sample drawing in I/R/R | ||
| 15 | SEALDATECHECK | Check Last Seal Date Against Current Date | ||
| 16 | VERBGL | Loss of certifiction if removed/replaced | ||
| 17 | VERLOS | Indicator: Loss of lot membership if removed/replaced |