Data Element list used by SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.)
SAP ABAP Table TE270 (System Parameters for Sampling Proc./Cert. in IS-U DevMan.) is using
# | Object Type | Object Name | Object Description | Note |
---|---|---|---|---|
1 | Data Element | BGLLOS | Device certification failure leads to loss of lot membership | |
2 | Data Element | CERTDEV | Certification period of device overrides lot | |
3 | Data Element | CERTLOTDEV | Only certified devices can be allocated to lots | |
4 | Data Element | CHBGL | Retain lot membership during certification | |
5 | Data Element | CHLOS | Manipulation of devices despite lot inspection/drawing | |
6 | Data Element | CHSTI | Repeated use of devices for inspection | |
7 | Data Element | INTPRF | Internal cert. period is longer than calibration validity | |
8 | Data Element | LAGINC | Warehouse devices allowed as sample devices | |
9 | Data Element | LOSLAGER | Uninstalled Devices Can Be Allocated to Lot | |
10 | Data Element | LOT_BREAKUP_PERIOD | No. of Years Within Which Lot Devices Must Be Replaced | |
11 | Data Element | MANDT | Client | |
12 | Data Element | NLBGLJ | Certification year same as installation year | |
13 | Data Element | NLEG97 | Certification/seal extension control | |
14 | Data Element | NO_SAMPLE_DEV | Exclude devices from sample drawing in I/R/R | |
15 | Data Element | SEALDATECHECK | Check Last Seal Date Against Current Date | |
16 | Data Element | VERBGL | Loss of certifiction if removed/replaced | |
17 | Data Element | VERLOS | Indicator: Loss of lot membership if removed/replaced |