SAP ABAP Data Element LOSFAELL (Next due year of sample lot)
Hierarchy
IS-UT (Software Component) SAP Utilities/Telecommunication
   IS-U-DM (Application Component) Device Management
     EE10 (Package) IS-U: Device Management
Basic Data
Data Element LOSFAELL
Short Description Next due year of sample lot  
Data Type
Category of Dictionary Type D   Domain
Type of Object Referenced     No Information
Domain / Name of Reference Type JAHR    
Data Type NUMC   Character string with only digits 
Length 4    
Decimal Places 0    
Output Length 4    
Value Table      
Further Characteristics
Search Help: Name    
Search Help: Parameters    
Parameter ID   
Default Component name    
Change document    
No Input History    
Basic direction is set to LTR    
No BIDI Filtering    
Field Label
  Length  Field Label  
Short 10 Year due 
Medium 15 Next due year 
Long 20 Next due year 
Heading YDue 
Documentation

Use

Specifies the year in which the lot must be inspected again.

Procedure

The following applies to official lots depending on the result of the last sampling inspection:

  • Failed
    • If it is the first sampling inspection since creation of the lot, enter the year in which the first inspection took place.
    • If it is a later sampling inspection, enter the year in which all lot devices are to be replaced again.
  • Passed

    The new due year is obtained by adding the lot renewal period to the due year.

    This is determined by law for devices that are subject to certification for each division category.

Dependencies

The following applies to official and internal lots:

You can only enter the next due year if at least one drawing has taken place in the current year.

History
Last changed by/on SAP  20050224 
SAP Release Created in