Where Used List (Class) for SAP ABAP Class Method CL_TEST_CHIP_RUNTIME_ENV-DESTROY_CHIP_WIRING_RUNTIME (CHIP Runtime Environment WD)
SAP ABAP Class Method 
CL_TEST_CHIP_RUNTIME_ENV - DESTROY_CHIP_WIRING_RUNTIME (CHIP Runtime Environment WD) is used by
| # | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
|---|---|---|---|---|---|---|
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| 1 |  Class |
CL_UNIT_TEST_CHIP_RUNTIME | Unit Tests at CHIP Runtime |  SWDP_CCP_API_TEST |
SAP_UI_ROOT |
 SAP_UI |
| 2 | Class |
CL_UNIT_TEST_CHIP_WIRING | Unit Tests for Wiring Runtime | SWDP_CCP_API_TEST |
SAP_UI_ROOT |
SAP_UI |
