SAP ABAP Class CL_TEST_CHIP_RUNTIME_ENV (CHIP Runtime Environment WD)

Hierarchy

☛ SAP_UI (Software Component) User Interface Technology
   ⤷ BC-WD-ABA-PB (Application Component) WD ABAP Page Builder
     ⤷ SWDP_CCP_API_TEST (Package) Web Dynpro ABAP: CCP Integration API Test

Properties

Class	CL_TEST_CHIP_RUNTIME_ENV
Short Description	CHIP Runtime Environment WD
Super Class
Instantiability of a Class	2	Public
Final	☑

General Data

Message Class
Program status
Category	0
Package	SWDP_CCP_API_TEST	Web Dynpro ABAP: CCP Integration API Test
Created	20081223	SAP
Last change	20110908	SAP
Shared Memory-enabled	☐
Fixed point arithmetic	☑
Unicode checks active	☑

Forward declarations

#	Type group / Object type	Type	Type Description
1	ABAP	Type group use (TYPE-POOLS tp)	Type group use (TYPE-POOLS tp)

Interfaces

Class CL_TEST_CHIP_RUNTIME_ENV has no interface implemented.

Friends

Class CL_TEST_CHIP_RUNTIME_ENV has no friend class.

Attributes

Class CL_TEST_CHIP_RUNTIME_ENV has no attribute.

Methods

#	Method	Level	Visibility	Method type	Description	Created on
1	CREATE_CHIP_RUNTIME	Static method	Public	Method	Creates a test CHIP runtime	20081223
2	CREATE_CHIP_WIRING_RUNTIME	Static method	Public	Method	Creates a test CHIP Wiring runtime	20081223
3	DESTROY_CHIP_RUNTIME	Static method	Public	Method	Deletes a test CHIP runtime	20081223
4	DESTROY_CHIP_WIRING_RUNTIME	Static method	Public	Method	Deletes a test CHIP Wiring runtime	20081223

Events

Class CL_TEST_CHIP_RUNTIME_ENV has no event.

Types

Class CL_TEST_CHIP_RUNTIME_ENV has no local type.

Method Signatures

Method CREATE_CHIP_RUNTIME Signature

#	Type	Parameter	Pass Value	Optional	Typing Method	Associated Type	Default value	Description	Created on
1	Returning	TEST_CHIP_RUNTIME	Value transfer	☐	Object reference (TYPE REF TO)	IF_TEST_CHIP_RUNTIME		CHIP Runtime WD	20081223

Method CREATE_CHIP_RUNTIME on class CL_TEST_CHIP_RUNTIME_ENV has no exception.

Method CREATE_CHIP_WIRING_RUNTIME Signature

#	Type	Parameter	Pass Value	Optional	Typing Method	Associated Type	Default value	Description	Created on
1	Importing	TEST_CHIP_RUNTIME	Call by reference	☐	Object reference (TYPE REF TO)	IF_TEST_CHIP_RUNTIME		Test CHIP Runtime	20081223
2	Returning	TEST_CHIP_WIRING_RUNTIME	Value transfer	☐	Object reference (TYPE REF TO)	IF_TEST_CHIP_WIRING_RUNTIME		Test CHIP Wiring Runtime	20081223

Method CREATE_CHIP_WIRING_RUNTIME on class CL_TEST_CHIP_RUNTIME_ENV has no exception.

Method DESTROY_CHIP_RUNTIME Signature

#	Type	Parameter	Pass Value	Optional	Typing Method	Associated Type	Default value	Description	Created on
1	Importing	TEST_CHIP_RUNTIME	Call by reference	☐	Object reference (TYPE REF TO)	IF_TEST_CHIP_RUNTIME		CHIP Runtime WD	20081223

Method DESTROY_CHIP_RUNTIME on class CL_TEST_CHIP_RUNTIME_ENV has no exception.

Method DESTROY_CHIP_WIRING_RUNTIME Signature

#	Type	Parameter	Pass Value	Optional	Typing Method	Associated Type	Default value	Description	Created on
1	Importing	TEST_CHIP_WIRING_RUNTIME	Call by reference	☐	Object reference (TYPE REF TO)	IF_TEST_CHIP_WIRING_RUNTIME		CHIP Wiring Runtime WD	20081223

Method DESTROY_CHIP_WIRING_RUNTIME on class CL_TEST_CHIP_RUNTIME_ENV has no exception.

History

Last changed by/on	SAP	20110908
SAP Release Created in	720