SAP ABAP Interface IF_TEST_CHIP_WIRING_RUNTIME (CHIP Wiring Runtime WD) is used by

• Class (8)

#	Object Type	Object Name	Object Description	Package	Structure Package	Software Component
1	Class	CL_TEST_CHIP_RUNTIME_ENV Method: DESTROY_CHIP_WIRING_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
2	Class	CL_TEST_CHIP_RUNTIME_ENV Method: CREATE_CHIP_WIRING_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
3	Class	CL_TEST_CHIP_RUNTIME_ENV	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
4	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: IF_TEST_CHIP_WIRING_RUNTIME~DESTROY	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
5	Class	CL_TEST_CHIP_WIRING_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
6	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: IF_TEST_CHIP_WIRING_RUNTIME~GET_CHIP_WIRING_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
7	Class	CL_UNIT_TEST_CHIP_RUNTIME	Unit Tests at CHIP Runtime	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
8	Class	CL_UNIT_TEST_CHIP_WIRING	Unit Tests for Wiring Runtime	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI