SAP ABAP Interface IF_TEST_CHIP_RUNTIME (CHIP Runtime WD) is used by

• Class (21)

#	Object Type	Object Name	Object Description	Package	Structure Package	Software Component
1	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~GET_CHIP_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
2	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~DESTROY_CHIP_INSTANCE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
3	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~DESTROY	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
4	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~GET_CHIP_INSTANCE_IDS	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
5	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~CREATE_CHIP_INSTANCE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
6	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~GET_CHIP_INSTANCE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
7	Class	CL_TEST_CHIP_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
8	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~DESTROY_ALL_CHIP_INSTANCES	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
9	Class	CL_TEST_CHIP_RUNTIME_ENV Method: DESTROY_CHIP_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
10	Class	CL_TEST_CHIP_RUNTIME_ENV Method: CREATE_CHIP_WIRING_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
11	Class	CL_TEST_CHIP_RUNTIME_ENV	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
12	Class	CL_TEST_CHIP_RUNTIME_ENV Method: CREATE_CHIP_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
13	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: FIRE_INPORT_EVENT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
14	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: IF_TEST_CHIP_WIRING_RUNTIME~DESTROY	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
15	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: CONSTRUCTOR	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
16	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLER_FOR_CHIP_CREATE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
17	Class	CL_TEST_CHIP_WIRING_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
18	Class	CL_TEST_CHIP_WIRING_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
19	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLER_FOR_CHIP_EXIT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
20	Class	CL_UNIT_TEST_CHIP_RUNTIME	Unit Tests at CHIP Runtime	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
21	Class	CL_UNIT_TEST_CHIP_WIRING	Unit Tests for Wiring Runtime	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI