SAP ABAP Class CL_TEST_CHIP_WIRING_RUNTIME (CHIP Runtime WD) is used by

• Class (11)

#	Object Type	Object Name	Object Description	Package	Structure Package	Software Component
1	Class	CL_TEST_CHIP_RUNTIME_ENV Method: CREATE_CHIP_WIRING_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
2	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLER_FOR_CHIP_DESTROY	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
3	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: FIRE_INPORT_EVENT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
4	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLE_OUTPORT_EVENT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
5	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: IF_TEST_CHIP_WIRING_RUNTIME~GET_CHIP_WIRING_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
6	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLER_FOR_CHIP_INIT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
7	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: CONSTRUCTOR	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
8	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLER_FOR_CHIP_EXIT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
9	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLER_FOR_CHIP_CREATE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
10	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: HANDLE_INPORT_EVENT	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
11	Class	CL_TEST_CHIP_WIRING_RUNTIME Method: IF_TEST_CHIP_WIRING_RUNTIME~DESTROY	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI