SAP ABAP Class CL_TEST_CHIP_RUNTIME (CHIP Runtime WD) is used by

• Class (9)

#	Object Type	Object Name	Object Description	Package	Structure Package	Software Component
1	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~DESTROY_CHIP_INSTANCE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
2	Class	CL_TEST_CHIP_RUNTIME Method: CONSTRUCTOR	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
3	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~GET_CHIP_INSTANCE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
4	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~DESTROY	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
5	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~DESTROY_ALL_CHIP_INSTANCES	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
6	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~GET_CHIP_RUNTIME	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
7	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~CREATE_CHIP_INSTANCE	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
8	Class	CL_TEST_CHIP_RUNTIME Method: IF_TEST_CHIP_RUNTIME~GET_CHIP_INSTANCE_IDS	CHIP Runtime WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI
9	Class	CL_TEST_CHIP_RUNTIME_ENV Method: CREATE_CHIP_RUNTIME	CHIP Runtime Environment WD	SWDP_CCP_API_TEST	SAP_UI_ROOT	SAP_UI