Hierarchy
SAP_APPL (Software Component) Logistics and Accounting⤷
QM-PT-BD-SPL (Application Component) Samples and SPC⤷
QD (Package) QM dynamic modification
Basic Data
| Data Element | QKZMFSAB |
| Short Description | Dependent Multiple Samples |
Data Type
| Category of Dictionary Type | D | Domain |
| Type of Object Referenced | No Information | |
| Domain / Name of Reference Type | QKZ | |
| Data Type | CHAR | Character String |
| Length | 1 | |
| Decimal Places | 0 | |
| Output Length | 1 | |
| Value Table |
Further Characteristics
| Search Help: Name | ||
| Search Help: Parameters | ||
| Parameter ID | ||
| Default Component name | ||
| Change document | ||
| No Input History | ||
| Basic direction is set to LTR | ||
| No BIDI Filtering |
Field Label
| Length | Field Label | |
| Short | 10 | DepMultSmp |
| Medium | 15 | Dep. multiSamps |
| Long | 20 | Dep. multiple Samps |
| Heading | 3 | DMS |
Documentation
Use
If you set this indicator, you can process double samples and multiple samples (up to seven) in accordance with ISO 2859-1.
Procedure
Examples
You are processing an inspection with dependent multiple samples.
When you valuate the inspection results, you cannot make a conclusive valuation for the inspection lot, because the number of nonconforming units or defects in the sample determined during results recording lies between the acceptance and rejection number.
The system then determines the next sampling plan from the sampling scheme that forms the basis for inspection.
The sample size and the number of nonconforming units cumulate when you process dependent multiple samples.
Dependencies
If you want to use dependent multiple samples, you must:
- Use a sampling type with a sampling scheme.
- Use a valuation mode for an attributive inspection.
- Set the indicator 'dependent multiple samples' in Customizing for the valuation rule and define the function module for the valuation of dependent multiple samples.
- Set the indicator for dependent multiple samples in the sampling procedure.
Note: Multiple samples and inspection points are mutually exclusive.
History
| Last changed by/on | SAP | 19980706 |
| SAP Release Created in |
