Where Used List (Class) for SAP ABAP Class Method CL_UNIT_TEST_CHIP_GENERIC-TRANSFORM_EVENT (Generice Instance of a CHIP)
SAP ABAP Class Method
CL_UNIT_TEST_CHIP_GENERIC - TRANSFORM_EVENT (Generice Instance of a CHIP) is used by
| # | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
|---|---|---|---|---|---|---|
| 1 |
CL_UNIT_TEST_CHIP_GENERIC Method: HANDLE_INPORT_EVENT
|
Generice Instance of a CHIP | ||||
| 2 |
CL_UNIT_TEST_CHIP_GENERIC Method: FIRE_EVENT
|
Generice Instance of a CHIP | ||||
| 3 |
CL_UNIT_TEST_CHIP_GENERIC Method: HANDLE_INPORT_EVENT
|
Generice Instance of a CHIP | ||||
| 4 |
CL_UNIT_TEST_CHIP_GENERIC Method: FIRE_EVENT
|
Generice Instance of a CHIP | ||||