Where Used List (Class) for SAP ABAP Class Method CL_TEST_CHIP_WIRING_RUNTIME-HANDLE_INPORT_EVENT (CHIP Runtime WD)
SAP ABAP Class Method 
CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_INPORT_EVENT (CHIP Runtime WD) is used by
| # | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
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| 1 |  Class |
CL_TEST_CHIP_WIRING_RUNTIME Method: CONSTRUCTOR
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CHIP Runtime WD |  SWDP_CCP_API_TEST |
SAP_UI_ROOT |
 SAP_UI |
| 2 | Class |
CL_TEST_CHIP_WIRING_RUNTIME Method: IF_TEST_CHIP_WIRING_RUNTIME~DESTROY
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CHIP Runtime WD | SWDP_CCP_API_TEST |
SAP_UI_ROOT |
SAP_UI |
