Where Used List (Class) for SAP ABAP Table/Structure Field TEST_CHIP_PORT-PARAM_TIMS (TEST_CHIP_PORT)
SAP ABAP Table/Structure Field 
TEST_CHIP_PORT - PARAM_TIMS (TEST_CHIP_PORT) is used by
| # | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
|---|---|---|---|---|---|---|
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| 1 |  Class |
CL_UNIT_TEST_CHIP_XSD | Unit Tests for CHIP Remote Integration: XSD and XML |  SWDP_CCP_WD_API_TEST |
SAP_UI_ROOT |
 SAP_UI |
