Where Used List (Class) for SAP ABAP Class CL_UNIT_TEST_CHIP_GENERIC (Generice Instance of a CHIP)
SAP ABAP Class CL_UNIT_TEST_CHIP_GENERIC (Generice Instance of a CHIP) is used by
# | Object Type | Object Name | Object Description | Package | Structure Package | Software Component |
---|---|---|---|---|---|---|
1 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: FIRE_EVENT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
2 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: HANDLE_INPORT_EVENT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
3 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SPFLI_HANDLE_ACTION2
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
4 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SFLIGHT_SRC_HANDLE_EVENT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
5 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SBOOK_HANDLE_ACTION
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
6 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SPFLI_HANDLE_ACTION
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
7 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SPFLI_HANDLE_EVENT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
8 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SFLIGHT_SRC_HANDLE_ACTION
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
9 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: TRANSFORM_EVENT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
10 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: IF_TEST_CHIP~CHIP_DO_EXIT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
11 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: IF_TEST_CHIP~CHIP_DO_INIT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
12 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SFLIGHT_HANDLE_ACTION
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
13 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: IF_TEST_CHIP~CHIP_HANDLE_ACTION
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
14 | Class |
CL_UNIT_TEST_CHIP_GENERIC Method: SFLIGHT_HANDLE_EVENT
|
Generice Instance of a CHIP | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |
15 | Class | CL_UNIT_TEST_CHIP_WIRING | Unit Tests for Wiring Runtime | SWDP_CCP_API_TEST | SAP_UI_ROOT | SAP_UI |