Table/Structure Field list used by SAP ABAP Program SAPL0Q05 (Model View Maintenance)
SAP ABAP Program
SAPL0Q05 (Model View Maintenance) is using
| # | Object Type | Object Name | Object Description | Note |
|---|---|---|---|---|
| 1 | TQ30T - KURZTEXT | Short Text | SOURCE *TQ30T-KURZTEXT |
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| 2 | TQ30T - KURZTEXT | Short Text | SOURCE TQ30T-KURZTEXT |
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| 3 | TQ30T - KURZTEXT | Short Text | SOURCE *TQ30T-KURZTEXT |
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| 4 | TQ30T - KURZTEXT | Short Text | SOURCE TQ30T-KURZTEXT |
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| 5 | TQ30T - KURZTEXT | Short Text | SOURCE TQ30T-KURZTEXT |
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| 6 | TQ31T - HERKTXT | Inspection Lot Origin Text | SOURCE TQ31T-HERKTXT |
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| 7 | TQ31T - HERKTXT | Inspection Lot Origin Text | SOURCE TQ31T-HERKTXT |
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| 8 | TQ31T - HERKTXT | Inspection Lot Origin Text | SOURCE TQ31T-HERKTXT |
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| 9 | V_TQ30 - ART | Inspection Type | SOURCE FIELD V_TQ30-ART. |
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| 10 | V_TQ30 - ART | Inspection Type | SOURCE FIELD V_TQ30-ART. |
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| 11 | V_TQ30 - ART | Inspection Type | SOURCE *V_TQ30-ART |
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| 12 | V_TQ30 - ART | Inspection Type | SOURCE V_TQ30-ART |
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| 13 | V_TQ30 - ART | Inspection Type | SOURCE FIELD V_TQ30-ART. |
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| 14 | V_TQ30 - ART | Inspection Type | SOURCE FIELD V_TQ30-ART. |
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| 15 | V_TQ30 - ART | Inspection Type | SOURCE V_TQ30-ART |
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| 16 | V_TQ30 - ART | Inspection Type | SOURCE V_TQ30-ART |
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| 17 | V_TQ30 - AUART | Order Type for QM Orders As Default Value for Insp. Type | SOURCE FIELD V_TQ30-AUART MODULE CHECK_AUART ON REQUEST. |
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| 18 | V_TQ30 - AUART | Order Type for QM Orders As Default Value for Insp. Type | SOURCE FIELD V_TQ30-AUART. |
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| 19 | V_TQ30 - AUART | Order Type for QM Orders As Default Value for Insp. Type | SOURCE FIELD V_TQ30-AUART MODULE PF4_AUART. |
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| 20 | V_TQ30 - AUART | Order Type for QM Orders As Default Value for Insp. Type | SOURCE V_TQ30-AUART |
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| 21 | V_TQ30 - AUART | Order Type for QM Orders As Default Value for Insp. Type | SOURCE V_TQ30-AUART |
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| 22 | V_TQ30 - EINEMELD | One Quality Notification per Inspection Lot | SOURCE FIELD V_TQ30-EINEMELD. |
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| 23 | V_TQ30 - EINEMELD | One Quality Notification per Inspection Lot | SOURCE V_TQ30-EINEMELD |
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| 24 | V_TQ30 - EINEMELD | One Quality Notification per Inspection Lot | SOURCE V_TQ30-EINEMELD |
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| 25 | V_TQ30 - ERFSICHT | Recording View | SOURCE FIELD V_TQ30-ERFSICHT. |
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| 26 | V_TQ30 - ERFSICHT | Recording View | SOURCE FIELD V_TQ30-ERFSICHT MODULE PF4_ERFSICHT. |
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| 27 | V_TQ30 - ERFSICHT | Recording View | SOURCE V_TQ30-ERFSICHT |
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| 28 | V_TQ30 - ERFSICHT | Recording View | SOURCE V_TQ30-ERFSICHT |
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| 29 | V_TQ30 - KURZTEXT | Short Text | SOURCE FIELD V_TQ30-KURZTEXT. |
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| 30 | V_TQ30 - KURZTEXT | Short Text | SOURCE *V_TQ30-KURZTEXT |
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| 31 | V_TQ30 - KURZTEXT | Short Text | SOURCE V_TQ30-KURZTEXT |
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| 32 | V_TQ30 - KURZTEXT | Short Text | SOURCE FIELD V_TQ30-KURZTEXT. |
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| 33 | V_TQ30 - KURZTEXT | Short Text | SOURCE V_TQ30-KURZTEXT |
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| 34 | V_TQ30 - KZMESSAGE | Messages Should Be Displayed When Printing | SOURCE FIELD V_TQ30-KZMESSAGE. |
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| 35 | V_TQ30 - KZMESSAGE | Messages Should Be Displayed When Printing | SOURCE V_TQ30-KZMESSAGE |
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| 36 | V_TQ30 - KZMESSAGE | Messages Should Be Displayed When Printing | SOURCE V_TQ30-KZMESSAGE |
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| 37 | V_TQ30 - KZPADR | Print Inspection Instruction Immediately at Lot Creation | SOURCE FIELD V_TQ30-KZPADR. |
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| 38 | V_TQ30 - KZPADR | Print Inspection Instruction Immediately at Lot Creation | SOURCE V_TQ30-KZPADR |
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| 39 | V_TQ30 - KZPADR | Print Inspection Instruction Immediately at Lot Creation | SOURCE V_TQ30-KZPADR |
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| 40 | V_TQ30 - KZPZDR | Print Sample-Drawing Instruction Immediately at Lot Creation | SOURCE FIELD V_TQ30-KZPZDR. |
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| 41 | V_TQ30 - KZPZDR | Print Sample-Drawing Instruction Immediately at Lot Creation | SOURCE V_TQ30-KZPZDR |
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| 42 | V_TQ30 - KZPZDR | Print Sample-Drawing Instruction Immediately at Lot Creation | SOURCE V_TQ30-KZPZDR |
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| 43 | V_TQ30 - KZVEWERKS | Selected Set Must Be Available in Plant | SOURCE FIELD V_TQ30-KZVEWERKS. |
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| 44 | V_TQ30 - KZVEWERKS | Selected Set Must Be Available in Plant | SOURCE V_TQ30-KZVEWERKS |
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| 45 | V_TQ30 - KZVEWERKS | Selected Set Must Be Available in Plant | SOURCE V_TQ30-KZVEWERKS |
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| 46 | V_TQ30 - LTXA1 | Operation short text | SOURCE FIELD V_TQ30-LTXA1 MODULE CHECK_SPEZ ON CHAIN-REQUEST. |
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| 47 | V_TQ30 - LTXA1 | Operation short text | SOURCE FIELD V_TQ30-LTXA1. |
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| 48 | V_TQ30 - LTXA1 | Operation short text | SOURCE V_TQ30-LTXA1 |
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| 49 | V_TQ30 - LTXA1 | Operation short text | SOURCE V_TQ30-LTXA1 |
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| 50 | V_TQ30 - PPLVERW | Task List Usage | SOURCE FIELD V_TQ30-PPLVERW. |
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| 51 | V_TQ30 - PPLVERW | Task List Usage | SOURCE V_TQ30-PPLVERW |
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| 52 | V_TQ30 - PPLVERW | Task List Usage | SOURCE V_TQ30-PPLVERW |
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| 53 | V_TQ30 - PRART | Physical-Sample Type | SOURCE FIELD V_TQ30-PRART. |
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| 54 | V_TQ30 - PRART | Physical-Sample Type | SOURCE V_TQ30-PRART |
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| 55 | V_TQ30 - PRART | Physical-Sample Type | SOURCE V_TQ30-PRART |
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| 56 | V_TQ30 - QMART | Message Type | SOURCE FIELD V_TQ30-QMART MODULE CHECK_QMART ON REQUEST. |
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| 57 | V_TQ30 - QMART | Message Type | SOURCE FIELD V_TQ30-QMART MODULE PF4_QMART_I10. |
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| 58 | V_TQ30 - QMART | Message Type | SOURCE V_TQ30-QMART |
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| 59 | V_TQ30 - QMART | Message Type | SOURCE V_TQ30-QMART |
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| 60 | V_TQ30 - STEUS | Control key | SOURCE FIELD V_TQ30-STEUS. |
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| 61 | V_TQ30 - STEUS | Control key | SOURCE FIELD V_TQ30-STEUS. |
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| 62 | V_TQ30 - STEUS | Control key | SOURCE V_TQ30-STEUS |
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| 63 | V_TQ30 - STEUS | Control key | SOURCE V_TQ30-STEUS |
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| 64 | V_TQ30 - STSMA | Status Profile | SOURCE FIELD V_TQ30-STSMA MODULE CHECK_STSMA ON INPUT. |
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| 65 | V_TQ30 - STSMA | Status Profile | SOURCE V_TQ30-STSMA |
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| 66 | V_TQ30 - STSMA | Status Profile | SOURCE V_TQ30-STSMA |
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| 67 | V_TQ30 - VEMENGE | Selected Set for Usage Decision | SOURCE FIELD V_TQ30-VEMENGE. |
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| 68 | V_TQ30 - VEMENGE | Selected Set for Usage Decision | SOURCE V_TQ30-VEMENGE |
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| 69 | V_TQ30 - VEMENGE | Selected Set for Usage Decision | SOURCE V_TQ30-VEMENGE |
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| 70 | V_TQ30 - VORNR | Operation/Activity Number | SOURCE FIELD V_TQ30-VORNR. |
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| 71 | V_TQ30 - VORNR | Operation/Activity Number | SOURCE FIELD V_TQ30-VORNR. |
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| 72 | V_TQ30 - VORNR | Operation/Activity Number | SOURCE V_TQ30-VORNR |
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| 73 | V_TQ30 - VORNR | Operation/Activity Number | SOURCE V_TQ30-VORNR |
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| 74 | V_TQ31 - HERKTXT | Inspection Lot Origin Text | SOURCE FIELD V_TQ31-HERKTXT . |
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| 75 | V_TQ31 - HERKTXT | Inspection Lot Origin Text | SOURCE *V_TQ31-HERKTXT |
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| 76 | V_TQ31 - HERKTXT | Inspection Lot Origin Text | SOURCE V_TQ31-HERKTXT |
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| 77 | V_TQ31 - HERKUNFT | Inspection Lot Origin | SOURCE FIELD V_TQ31-HERKUNFT . |
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| 78 | V_TQ31 - HERKUNFT | Inspection Lot Origin | SOURCE FIELD V_TQ31-HERKUNFT . |
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| 79 | V_TQ31 - HERKUNFT | Inspection Lot Origin | SOURCE *V_TQ31-HERKUNFT |
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| 80 | V_TQ31 - HERKUNFT | Inspection Lot Origin | SOURCE V_TQ31-HERKUNFT |
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| 81 | V_TQ32 - ART | Inspection Type | SOURCE FIELD V_TQ32-ART. |
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| 82 | V_TQ32 - ART | Inspection Type | SOURCE FIELD V_TQ32-ART. |
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| 83 | V_TQ32 - ART | Inspection Type | SOURCE FIELD V_TQ32-ART. |
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| 84 | V_TQ32 - ART | Inspection Type | SOURCE FIELD V_TQ32-ART. |
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| 85 | V_TQ32 - ART | Inspection Type | SOURCE *V_TQ32-ART |
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| 86 | V_TQ32 - ART | Inspection Type | SOURCE V_TQ32-ART |
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| 87 | V_TQ32 - HERKUNFT | Inspection Lot Origin | SOURCE *V_TQ32-HERKUNFT |
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| 88 | V_TQ32 - HERKUNFT | Inspection Lot Origin | SOURCE V_TQ32-HERKUNFT |
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| 89 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE FIELD V_TQ32-VARIANTE. |
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| 90 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE FIELD V_TQ32-VARIANTE. |
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| 91 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE FIELD V_TQ32-VARIANTE |
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| 92 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE MODULE CHECK_ART_EINDEUTIG ON CHAIN-REQUEST. |
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| 93 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE FIELD V_TQ32-VARIANTE. |
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| 94 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE FIELD V_TQ32-VARIANTE. |
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| 95 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE *V_TQ32-VARIANTE |
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| 96 | V_TQ32 - VARIANTE | Variant of The Inspection Lot Origin | SOURCE V_TQ32-VARIANTE |
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| 97 | V_TQ33 - DYNKRIT | Dynamic Modification Criterion | SOURCE FIELD V_TQ33-DYNKRIT. |
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| 98 | V_TQ33 - DYNKRIT | Dynamic Modification Criterion | SOURCE *V_TQ33-DYNKRIT |
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| 99 | V_TQ33 - DYNKRIT | Dynamic Modification Criterion | SOURCE V_TQ33-DYNKRIT |
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| 100 | V_TQ33 - HERKUNFT | Inspection Lot Origin | SOURCE FIELD V_TQ33-HERKUNFT. |
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| 101 | V_TQ33 - HERKUNFT | Inspection Lot Origin | SOURCE FIELD V_TQ33-HERKUNFT. |
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| 102 | V_TQ33 - HERKUNFT | Inspection Lot Origin | SOURCE *V_TQ33-HERKUNFT |
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| 103 | V_TQ33 - HERKUNFT | Inspection Lot Origin | SOURCE V_TQ33-HERKUNFT |
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| 104 | V_TQ33 - NUMKR | Number range number | SOURCE FIELD V_TQ33-NUMKR. |
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| 105 | V_TQ33 - NUMKR | Number range number | SOURCE *V_TQ33-NUMKR |
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| 106 | V_TQ33 - NUMKR | Number range number | SOURCE V_TQ33-NUMKR |
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| 107 | V_TQ33 - PLNST | Status | SOURCE FIELD V_TQ33-PLNST. |
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| 108 | V_TQ33 - PLNST | Status | SOURCE *V_TQ33-PLNST |
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| 109 | V_TQ33 - PLNST | Status | SOURCE V_TQ33-PLNST |
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| 110 | V_TQ33 - PLNTY | Task List Type | SOURCE FIELD V_TQ33-PLNTY. |
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| 111 | V_TQ33 - PLNTY | Task List Type | SOURCE *V_TQ33-PLNTY |
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| 112 | V_TQ33 - PLNTY | Task List Type | SOURCE V_TQ33-PLNTY |
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| 113 | V_TQ34 - AFR | Inspection for Handling Unit | SOURCE FIELD V_TQ34-AFR. |
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| 114 | V_TQ34 - AFR | Inspection for Handling Unit | SOURCE FIELD V_TQ34-AFR. |
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| 115 | V_TQ34 - AFR | Inspection for Handling Unit | SOURCE V_TQ34-AFR |
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| 116 | V_TQ34 - AFR | Inspection for Handling Unit | SOURCE V_TQ34-AFR |
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| 117 | V_TQ34 - APP | Automatic Specification Assignment | SOURCE FIELD V_TQ34-APP. |
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| 118 | V_TQ34 - APP | Automatic Specification Assignment | SOURCE FIELD V_TQ34-APP. |
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| 119 | V_TQ34 - APP | Automatic Specification Assignment | SOURCE FIELD V_TQ34-APP. |
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| 120 | V_TQ34 - APP | Automatic Specification Assignment | SOURCE V_TQ34-APP |
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| 121 | V_TQ34 - APP | Automatic Specification Assignment | SOURCE V_TQ34-APP |
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| 122 | V_TQ34 - ART | Inspection Type | SOURCE FIELD V_TQ34-ART. |
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| 123 | V_TQ34 - ART | Inspection Type | SOURCE FIELD V_TQ34-ART. |
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| 124 | V_TQ34 - ART | Inspection Type | SOURCE *V_TQ34-ART |
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| 125 | V_TQ34 - ART | Inspection Type | SOURCE V_TQ34-ART |
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| 126 | V_TQ34 - ART | Inspection Type | SOURCE FIELD V_TQ34-ART MODULE CHECK_ART ON REQUEST. |
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| 127 | V_TQ34 - ART | Inspection Type | SOURCE FIELD V_TQ34-ART. |
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| 128 | V_TQ34 - ART | Inspection Type | SOURCE FIELD V_TQ34-ART. |
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| 129 | V_TQ34 - ART | Inspection Type | SOURCE FIELD V_TQ34-ART. |
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| 130 | V_TQ34 - ART | Inspection Type | SOURCE V_TQ34-ART |
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| 131 | V_TQ34 - ART | Inspection Type | SOURCE V_TQ34-ART |
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| 132 | V_TQ34 - AVE | Automatic Usage Decision | SOURCE FIELD V_TQ34-AVE. |
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| 133 | V_TQ34 - AVE | Automatic Usage Decision | SOURCE FIELD V_TQ34-AVE. |
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| 134 | V_TQ34 - AVE | Automatic Usage Decision | SOURCE V_TQ34-AVE |
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| 135 | V_TQ34 - AVE | Automatic Usage Decision | SOURCE V_TQ34-AVE |
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| 136 | V_TQ34 - CHG | Control of Inspection Lot Creation (Lot Summary) | SOURCE FIELD V_TQ34-CHG. |
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| 137 | V_TQ34 - CHG | Control of Inspection Lot Creation (Lot Summary) | SOURCE FIELD V_TQ34-CHG. |
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| 138 | V_TQ34 - CHG | Control of Inspection Lot Creation (Lot Summary) | SOURCE FIELD V_TQ34-CHG MODULE SELECT_Q1WELOS. |
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| 139 | V_TQ34 - CHG | Control of Inspection Lot Creation (Lot Summary) | SOURCE V_TQ34-CHG |
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| 140 | V_TQ34 - CHG | Control of Inspection Lot Creation (Lot Summary) | SOURCE V_TQ34-CHG |
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| 141 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 142 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 143 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 144 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 145 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 146 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 147 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 148 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE FIELD V_TQ34-CONF. |
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| 149 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE V_TQ34-CONF |
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| 150 | V_TQ34 - CONF | Inspection Specifications from Configuration | SOURCE V_TQ34-CONF |
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| 151 | V_TQ34 - DYN | Skips Allowed | SOURCE FIELD V_TQ34-DYN. |
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| 152 | V_TQ34 - DYN | Skips Allowed | SOURCE FIELD V_TQ34-DYN. |
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| 153 | V_TQ34 - DYN | Skips Allowed | SOURCE V_TQ34-DYN |
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| 154 | V_TQ34 - DYN | Skips Allowed | SOURCE V_TQ34-DYN |
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| 155 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE FIELD V_TQ34-DYNREGEL |
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| 156 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE MODULE CHECK_DYNREGEL ON REQUEST. |
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| 157 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE FIELD V_TQ34-DYNREGEL. |
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| 158 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE FIELD V_TQ34-DYNREGEL. |
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| 159 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE FIELD V_TQ34-DYNREGEL. |
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| 160 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE FIELD V_TQ34-DYNREGEL. |
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| 161 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE FIELD V_TQ34-DYNREGEL. |
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| 162 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE V_TQ34-DYNREGEL |
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| 163 | V_TQ34 - DYNREGEL | Dynamic Modification Rule | SOURCE V_TQ34-DYNREGEL |
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| 164 | V_TQ34 - EIN | Serial Number Management Possible | SOURCE FIELD V_TQ34-EIN. |
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| 165 | V_TQ34 - EIN | Serial Number Management Possible | SOURCE FIELD V_TQ34-EIN. |
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| 166 | V_TQ34 - EIN | Serial Number Management Possible | SOURCE V_TQ34-EIN |
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| 167 | V_TQ34 - EIN | Serial Number Management Possible | SOURCE V_TQ34-EIN |
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| 168 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 169 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 170 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 171 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 172 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 173 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 174 | V_TQ34 - HPZ | 100% Inspection | SOURCE FIELD V_TQ34-HPZ. |
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| 175 | V_TQ34 - HPZ | 100% Inspection | SOURCE V_TQ34-HPZ |
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| 176 | V_TQ34 - HPZ | 100% Inspection | SOURCE V_TQ34-HPZ |
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| 177 | V_TQ34 - INSMK | Post to inspection stock | SOURCE FIELD V_TQ34-INSMK. |
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| 178 | V_TQ34 - INSMK | Post to inspection stock | SOURCE FIELD V_TQ34-INSMK. |
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| 179 | V_TQ34 - INSMK | Post to inspection stock | SOURCE V_TQ34-INSMK |
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| 180 | V_TQ34 - INSMK | Post to inspection stock | SOURCE V_TQ34-INSMK |
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| 181 | V_TQ34 - MER | Inspect by Characteristics | SOURCE FIELD V_TQ34-MER. |
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| 182 | V_TQ34 - MER | Inspect by Characteristics | SOURCE FIELD V_TQ34-MER. |
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| 183 | V_TQ34 - MER | Inspect by Characteristics | SOURCE FIELD V_TQ34-MER. |
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| 184 | V_TQ34 - MER | Inspect by Characteristics | SOURCE FIELD V_TQ34-MER. |
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| 185 | V_TQ34 - MER | Inspect by Characteristics | SOURCE V_TQ34-MER |
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| 186 | V_TQ34 - MER | Inspect by Characteristics | SOURCE V_TQ34-MER |
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| 187 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 188 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 189 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 190 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 191 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 192 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 193 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE FIELD V_TQ34-MPB. |
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| 194 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE V_TQ34-MPB |
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| 195 | V_TQ34 - MPB | Enter the Sample Manually | SOURCE V_TQ34-MPB |
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| 196 | V_TQ34 - MPDAU | Average Inspection Duration | SOURCE FIELD V_TQ34-MPDAU. |
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| 197 | V_TQ34 - MPDAU | Average Inspection Duration | SOURCE FIELD V_TQ34-MPDAU. |
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| 198 | V_TQ34 - MPDAU | Average Inspection Duration | SOURCE V_TQ34-MPDAU |
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| 199 | V_TQ34 - MPDAU | Average Inspection Duration | SOURCE V_TQ34-MPDAU |
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| 200 | V_TQ34 - MST | Trigger Sample Calculation Manually | SOURCE FIELD V_TQ34-MST. |
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| 201 | V_TQ34 - MST | Trigger Sample Calculation Manually | SOURCE FIELD V_TQ34-MST. |
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| 202 | V_TQ34 - MST | Trigger Sample Calculation Manually | SOURCE FIELD V_TQ34-MST. |
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| 203 | V_TQ34 - MST | Trigger Sample Calculation Manually | SOURCE FIELD V_TQ34-MST. |
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| 204 | V_TQ34 - MST | Trigger Sample Calculation Manually | SOURCE V_TQ34-MST |
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| 205 | V_TQ34 - MST | Trigger Sample Calculation Manually | SOURCE V_TQ34-MST |
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| 206 | V_TQ34 - MS_FLAG | Indicator: Multiple Specifications | SOURCE FIELD v_tq34-ms_flag. |
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| 207 | V_TQ34 - MS_FLAG | Indicator: Multiple Specifications | SOURCE FIELD V_TQ34-MS_FLAG. |
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| 208 | V_TQ34 - MS_FLAG | Indicator: Multiple Specifications | SOURCE FIELD V_TQ34-MS_FLAG. |
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| 209 | V_TQ34 - MS_FLAG | Indicator: Multiple Specifications | SOURCE V_TQ34-MS_FLAG |
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| 210 | V_TQ34 - MS_FLAG | Indicator: Multiple Specifications | SOURCE V_TQ34-MS_FLAG |
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| 211 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 212 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 213 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 214 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 215 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 216 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 217 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 218 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD v_tq34-ppl. |
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| 219 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 220 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 221 | V_TQ34 - PPL | Inspection with Task List | SOURCE FIELD V_TQ34-PPL. |
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| 222 | V_TQ34 - PPL | Inspection with Task List | SOURCE V_TQ34-PPL |
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| 223 | V_TQ34 - PPL | Inspection with Task List | SOURCE V_TQ34-PPL |
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| 224 | V_TQ34 - QKZVERF | Procedure for Calculating Quality Score | SOURCE FIELD V_TQ34-QKZVERF. |
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| 225 | V_TQ34 - QKZVERF | Procedure for Calculating Quality Score | SOURCE FIELD V_TQ34-QKZVERF. |
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| 226 | V_TQ34 - QKZVERF | Procedure for Calculating Quality Score | SOURCE FIELD V_TQ34-QKZVERF. |
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| 227 | V_TQ34 - QKZVERF | Procedure for Calculating Quality Score | SOURCE FIELD V_TQ34-QKZVERF. |
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| 228 | V_TQ34 - QKZVERF | Procedure for Calculating Quality Score | SOURCE V_TQ34-QKZVERF |
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| 229 | V_TQ34 - QKZVERF | Procedure for Calculating Quality Score | SOURCE V_TQ34-QKZVERF |
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| 230 | V_TQ34 - QPMAT | Allowed Share of Scrap (Percent) in Inspection Lot | SOURCE FIELD V_TQ34-QPMAT. |
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| 231 | V_TQ34 - QPMAT | Allowed Share of Scrap (Percent) in Inspection Lot | SOURCE FIELD V_TQ34-QPMAT. |
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| 232 | V_TQ34 - QPMAT | Allowed Share of Scrap (Percent) in Inspection Lot | SOURCE FIELD V_TQ34-QPMAT. |
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| 233 | V_TQ34 - QPMAT | Allowed Share of Scrap (Percent) in Inspection Lot | SOURCE V_TQ34-QPMAT |
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| 234 | V_TQ34 - QPMAT | Allowed Share of Scrap (Percent) in Inspection Lot | SOURCE V_TQ34-QPMAT |
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| 235 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 236 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 237 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 238 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 239 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 240 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 241 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 242 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE MODULE V_TQ34-SPEZUEBER ON CHAIN-REQUEST. |
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| 243 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 244 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE FIELD V_TQ34-SPEZUEBER. |
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| 245 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE V_TQ34-SPEZUEBER |
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| 246 | V_TQ34 - SPEZUEBER | Inspect with Material Specification | SOURCE V_TQ34-SPEZUEBER |
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| 247 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE FIELD V_TQ34-SPROZ. |
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| 248 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE FIELD V_TQ34-SPROZ. |
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| 249 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE FIELD V_TQ34-SPROZ. |
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| 250 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE FIELD V_TQ34-SPROZ MODULE CHECK_SPROZ ON REQUEST . |
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| 251 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE FIELD V_TQ34-SPROZ. |
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| 252 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE FIELD V_TQ34-SPROZ. |
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| 253 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE V_TQ34-SPROZ |
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| 254 | V_TQ34 - SPROZ | Inspection Percentage | SOURCE V_TQ34-SPROZ |
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| 255 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER |
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| 256 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE MODULE CHECK_STICHPRVER ON REQUEST. |
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| 257 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 258 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 259 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 260 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 261 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 262 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 263 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE FIELD V_TQ34-STICHPRVER. |
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| 264 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE V_TQ34-STICHPRVER |
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| 265 | V_TQ34 - STICHPRVER | Sampling Procedure | SOURCE V_TQ34-STICHPRVER |
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| 266 | V_TQ34 - TLS | Inspection Specifications from Batch Determination | SOURCE FIELD V_TQ34-TLS. |
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| 267 | V_TQ34 - TLS | Inspection Specifications from Batch Determination | SOURCE FIELD V_TQ34-TLS. |
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| 268 | V_TQ34 - TLS | Inspection Specifications from Batch Determination | SOURCE FIELD V_TQ34-TLS. |
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| 269 | V_TQ34 - TLS | Inspection Specifications from Batch Determination | SOURCE V_TQ34-TLS |
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| 270 | V_TQ34 - TLS | Inspection Specifications from Batch Determination | SOURCE V_TQ34-TLS |