Table/Structure Field list used by SAP ABAP Class CL_UNIT_TEST_CHIP_XSD (Unit Tests for CHIP Remote Integration: XSD and XML)
SAP ABAP Class 
CL_UNIT_TEST_CHIP_XSD (Unit Tests for CHIP Remote Integration: XSD and XML) is using
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Class (8)
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Data Element (7)
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Table/Structure Field (11)
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Function Module (2)
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Interface (9)
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Class Method (21)
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Table (3)
| # | Object Type | Object Name | Object Description | Note |
|---|---|---|---|---|
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| 1 | Table/Structure Field |
CHIP_NAME_TO_XML_RFC - CHIP_DEFINITION_VERSION | CHIP_NAME_TO_XML_RFC-CHIP_DEFINITION_VERSION | |
| 2 | Table/Structure Field |
CHIP_NAME_TO_XML_RFC - CHIP_NAME | CHIP: Name for RFC | |
| 3 | Table/Structure Field |
CHIP_PORT_INFO - PORT_DESCRIPTION | CHIP_PORT_INFO-PORT_DESCRIPTION | |
| 4 | Table/Structure Field |
CHIP_PORT_INFO - PORT_NAME | CHIP_PORT_INFO-PORT_NAME | |
| 5 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_DATS | TEST_CHIP_PORT-PARAM_DATS | |
| 6 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_INT1 | TEST_CHIP_PORT-PARAM_INT1 | |
| 7 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_INT2 | Test CHIP: INT2 | |
| 8 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_INT4 | Test CHIP: INT4 | |
| 9 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_STRING | TEST_CHIP_PORT-PARAM_STRING | |
| 10 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_TIMS | TEST_CHIP_PORT-PARAM_TIMS | |
| 11 | Table/Structure Field |
TEST_CHIP_PORT - PARAM_WDY_BOOLEAN | Replacement for Real Boolean Type: 'X' == True '' == False |
