Table/Structure Field list used by SAP ABAP Class CL_UNIT_TEST_CHIP_RUNTIME (Unit Tests at CHIP Runtime)
SAP ABAP Class 
CL_UNIT_TEST_CHIP_RUNTIME (Unit Tests at CHIP Runtime) is using
Class Method (25)| # | Object Type | Object Name | Object Description | Note |
|---|---|---|---|---|
 |
|
|||
| 1 |  Table/Structure Field |
CHIP_PAGE_PORT_WIRING_PARAM - INPORT_PARAMETER | CHIP_PAGE_PORT_WIRING_PARAM-INPORT_PARAMETER | |
| 2 | Table/Structure Field |
CHIP_PAGE_PORT_WIRING_PARAM - SOURCE_CHIP_INSTANCE_ID | CHIP_PAGE_PORT_WIRING_PARAM-SOURCE_CHIP_INSTANCE_ID | |
| 3 | Table/Structure Field |
CHIP_PAGE_PORT_WIRING_PARAM - SOURCE_OUTPORT | CHIP_PAGE_PORT_WIRING_PARAM-SOURCE_OUTPORT | |
| 4 | Table/Structure Field |
CHIP_PAGE_PORT_WIRING_PARAM - SOURCE_OUTPORT_PARAMETER | CHIP_PAGE_PORT_WIRING_PARAM-SOURCE_OUTPORT_PARAMETER | |
| 5 | Table/Structure Field |
CHIP_PAGE_PORT_WIRING_PARAM - WIRING_TYPE | Type of Assignment of an Inport Parameter for Wiring | |
