Class Method list used by SAP ABAP Class CL_TEST_CHIP_WIRING_RUNTIME (CHIP Runtime WD)
SAP ABAP Class CL_TEST_CHIP_WIRING_RUNTIME (CHIP Runtime WD) is using
# | Object Type | Object Name | Object Description | Note |
---|---|---|---|---|
1 | Class Method | CL_CHIP_RUNTIME_ENVIRONMENT - GET_WIRING_RUNTIME | CHIP Runtime Environment | |
2 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE fire_inport_event( |
3 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_OUTPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_outport_event for l_chip_instance activation abap_false. |
4 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_OUTPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_outport_event for l_chip_instance activation abap_true. |
5 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_INPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_inport_event for m_chip_wiring_runtime activation abap_false. |
6 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_INPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_inport_event for m_chip_wiring_runtime. |
7 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_INIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_init for m_test_chip_runtime activation abap_false. |
8 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_INIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_init for m_test_chip_runtime. |
9 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_EXIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_exit for m_test_chip_runtime activation abap_false. |
10 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_DESTROY | CHIP Runtime WD | SOURCE set handler handler_for_chip_destroy for m_test_chip_runtime activation abap_false. |
11 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_DESTROY | CHIP Runtime WD | SOURCE set handler handler_for_chip_destroy for m_test_chip_runtime. |
12 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_CREATE | CHIP Runtime WD | SOURCE set handler handler_for_chip_create for m_test_chip_runtime activation abap_false. |
13 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_CREATE | CHIP Runtime WD | SOURCE set handler handler_for_chip_create for m_test_chip_runtime. |
14 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE ). |
15 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE inport_event = inport_event |
16 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE chip_instance_id = target_chip_instance_id |
17 | Class Method | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_EXIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_exit for m_test_chip_runtime. |
18 | Class Method | IF_CHIP_INSTANCE - FIRE_INPORT_EVENT | CHIP Instance | |
19 | Class Method | IF_CHIP_INSTANCE - GET_INSTANCE_ID | CHIP Instance | |
20 | Class Method | IF_CHIP_WIRING_RUNTIME - CHIP_ENVIRONMENT_CHANGED | CHIP Wiring Runtime | |
21 | Class Method | IF_CHIP_WIRING_RUNTIME - FIRE_OUTPORT_EVENT | CHIP Wiring Runtime | |
22 | Class Method | IF_CHIP_WIRING_RUNTIME - CHIP_ENVIRONMENT_CHANGED | CHIP Wiring Runtime | |
23 | Class Method | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE | CHIP Runtime WD | |
24 | Class Method | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE | CHIP Runtime WD | |
25 | Class Method | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE | CHIP Runtime WD | |
26 | Class Method | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE_IDS | CHIP Runtime WD | |
27 | Class Method | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE_IDS | CHIP Runtime WD | |
28 | Class Method | IF_TEST_CHIP_WIRING_RUNTIME - DESTROY | CHIP Wiring Runtime WD | |
29 | Class Method | IF_TEST_CHIP_WIRING_RUNTIME - GET_CHIP_WIRING_RUNTIME | CHIP Wiring Runtime WD |