Class Method list used by SAP ABAP Class CL_TEST_CHIP_WIRING_RUNTIME (CHIP Runtime WD)
SAP ABAP Class
CL_TEST_CHIP_WIRING_RUNTIME (CHIP Runtime WD) is using
| # | Object Type | Object Name | Object Description | Note |
|---|---|---|---|---|
| 1 | CL_CHIP_RUNTIME_ENVIRONMENT - GET_WIRING_RUNTIME | CHIP Runtime Environment | ||
| 2 | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE fire_inport_event( |
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| 3 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_OUTPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_outport_event for l_chip_instance activation abap_false. |
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| 4 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_OUTPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_outport_event for l_chip_instance activation abap_true. |
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| 5 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_INPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_inport_event for m_chip_wiring_runtime activation abap_false. |
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| 6 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLE_INPORT_EVENT | CHIP Runtime WD | SOURCE set handler handle_inport_event for m_chip_wiring_runtime. |
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| 7 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_INIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_init for m_test_chip_runtime activation abap_false. |
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| 8 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_INIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_init for m_test_chip_runtime. |
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| 9 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_EXIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_exit for m_test_chip_runtime activation abap_false. |
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| 10 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_DESTROY | CHIP Runtime WD | SOURCE set handler handler_for_chip_destroy for m_test_chip_runtime activation abap_false. |
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| 11 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_DESTROY | CHIP Runtime WD | SOURCE set handler handler_for_chip_destroy for m_test_chip_runtime. |
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| 12 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_CREATE | CHIP Runtime WD | SOURCE set handler handler_for_chip_create for m_test_chip_runtime activation abap_false. |
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| 13 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_CREATE | CHIP Runtime WD | SOURCE set handler handler_for_chip_create for m_test_chip_runtime. |
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| 14 | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE ). |
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| 15 | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE inport_event = inport_event |
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| 16 | CL_TEST_CHIP_WIRING_RUNTIME - FIRE_INPORT_EVENT | CHIP Runtime WD | SOURCE chip_instance_id = target_chip_instance_id |
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| 17 | CL_TEST_CHIP_WIRING_RUNTIME - HANDLER_FOR_CHIP_EXIT | CHIP Runtime WD | SOURCE set handler handler_for_chip_exit for m_test_chip_runtime. |
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| 18 | IF_CHIP_INSTANCE - FIRE_INPORT_EVENT | CHIP Instance | ||
| 19 | IF_CHIP_INSTANCE - GET_INSTANCE_ID | CHIP Instance | ||
| 20 | IF_CHIP_WIRING_RUNTIME - CHIP_ENVIRONMENT_CHANGED | CHIP Wiring Runtime | ||
| 21 | IF_CHIP_WIRING_RUNTIME - FIRE_OUTPORT_EVENT | CHIP Wiring Runtime | ||
| 22 | IF_CHIP_WIRING_RUNTIME - CHIP_ENVIRONMENT_CHANGED | CHIP Wiring Runtime | ||
| 23 | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE | CHIP Runtime WD | ||
| 24 | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE | CHIP Runtime WD | ||
| 25 | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE | CHIP Runtime WD | ||
| 26 | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE_IDS | CHIP Runtime WD | ||
| 27 | IF_TEST_CHIP_RUNTIME - GET_CHIP_INSTANCE_IDS | CHIP Runtime WD | ||
| 28 | IF_TEST_CHIP_WIRING_RUNTIME - DESTROY | CHIP Wiring Runtime WD | ||
| 29 | IF_TEST_CHIP_WIRING_RUNTIME - GET_CHIP_WIRING_RUNTIME | CHIP Wiring Runtime WD |