Class list used by SAP ABAP Class CL_CHIP_WB_COMP_USAGE (Test Class for CHIP Usages)
SAP ABAP Class
CL_CHIP_WB_COMP_USAGE (Test Class for CHIP Usages) is using
| # | Object Type | Object Name | Object Description | Note |
|---|---|---|---|---|
| 1 | CL_ABAP_OBJECTDESCR | Runtime Type Services | ||
| 2 | CL_CHIP_PORT_HELPER | Help Classes for Creating Ports | ||
| 3 | CL_CHIP_PORT_OBJECT | CHIP Port Object Implementation | ||
| 4 | CL_CHIP_PROVIDER_WD_WB | Provider Class for ABAP Workbench CHIPs | ||
| 5 | CL_CHIP_WB_COMP_USAGE | Test Class for CHIP Usages | ||
| 6 | CL_CHIP_WB_COMP_USAGE | Test Class for CHIP Usages | ||
| 7 | CL_CHIP_WB_COMP_USAGE | Test Class for CHIP Usages | ||
| 8 | CL_CHIP_WB_COMP_USAGE | Test Class for CHIP Usages | ||
| 9 | CL_CHIP_WB_COMP_USAGE | Test Class for CHIP Usages | ||
| 10 | CL_CHIP_WB_COMP_USAGE | Test Class for CHIP Usages | ||
| 11 | CL_WDY_MD_CHIP_FACTORY | Factory to Create CHIPs | ||
| 12 | CL_WDY_WB_NAMING_SERVICE | Name Change: WDY Object <-> Gen. ABAP Object | ||
| 13 | CL_WD_CUSTOM_EVENT | Application-Defined Event | ||
| 14 | CL_WD_CUSTOM_EVENT | Application-Defined Event | ||
| 15 | CL_WD_CUSTOM_EVENT | Application-Defined Event | ||
| 16 | CX_CHIP_DEFINITION_ERROR | WD CHIP: Metadata Error | ||
| 17 | CX_CHIP_DEFINITION_ERROR | WD CHIP: Metadata Error | ||
| 18 | CX_CHIP_RUNTIME | CHIP Runtime Exception | ||
| 19 | CX_ROOT | Abstract Superclass for All Global Exceptions | ||
| 20 | CX_ROOT | Abstract Superclass for All Global Exceptions | ||
| 21 | CX_STATIC_CHECK | Exceptions with Static and Dynamic Check of RAISING Clause | ||
| 22 | CX_STATIC_CHECK | Exceptions with Static and Dynamic Check of RAISING Clause | ||
| 23 | CX_STATIC_CHECK | Exceptions with Static and Dynamic Check of RAISING Clause | ||
| 24 | CX_STATIC_CHECK | Exceptions with Static and Dynamic Check of RAISING Clause | ||
| 25 | CX_SY_DYN_CALL_ERROR | System Exception During Dynamic Calls of Any Kind |