SAP ABAP Data Element E_BIS (Number of Last Object to be Tested)
Hierarchy
☛
IS-UT (Software Component) SAP Utilities/Telecommunication
⤷ IS-U-DM (Application Component) Device Management
⤷ EE07TOOLS (Package) IS-U Device Checker, Analysis and Repair
⤷ IS-U-DM (Application Component) Device Management
⤷ EE07TOOLS (Package) IS-U Device Checker, Analysis and Repair
Basic Data
Data Element | E_BIS |
Short Description | Number of Last Object to be Tested |
Data Type
Category of Dictionary Type | D | Domain |
Type of Object Referenced | No Information | |
Domain / Name of Reference Type | CHAR30 | |
Data Type | CHAR | Character String |
Length | 30 | |
Decimal Places | 0 | |
Output Length | 30 | |
Value Table |
Further Characteristics
Search Help: Name | ||
Search Help: Parameters | ||
Parameter ID | ||
Default Component name | ||
Change document | ||
No Input History | ||
Basic direction is set to LTR | ||
No BIDI Filtering |
Field Label
Length | Field Label | |
Short | 10 | LastObjNo. |
Medium | 15 | No. Last Object |
Long | 20 | No. Last Object |
Heading | 30 | Last Object to be Tested |
Documentation
Definition
You can limit the test area for an initial object.
Specify the number of the object from the category of the run field, to which the test combination should be carried out.
If you want the test to include all objects, leave the field blank.
History
Last changed by/on | SAP | 20050224 |
SAP Release Created in |